JEOL USA Blog

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High Speed Milling for Rapid Cross-Section Polishing

Applying high speed milling for rapid cross-section polishing can reduce preparation time and improve SEM, EDS, and EBSD analytical performance.

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What Is 3D Metal Printing via EBM?

3D metal printing via EBM is a unique, high-energy pathway that operates in a vacuum environment, providing remarkably energy efficient and reliable additive manufacturing.

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A Deep Dive into JEOL SEM Microscopes—Which is Right for You?

Read through our deep dive into JEOL SEM microscopes, where we detail our Benchtop, InTouchScope™, and Field Emission SEMs, to learn which is right for you.

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What is Correlative Light and Electron Microscopy?

Correlative light and electron microscopy (CLEM) is a correlative imaging approach that links molecular function with ultrastructure. Learn more about it now!

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Where Do Silicon Drift Detectors Fit into EDS?

Silicon drift detectors (SDDs) fit into energy dispersive spectroscopy (EDS) by enabling high count rates, low noise, improved energy resolution, and energy mapping.

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How E-Beam Lithography Shapes the Semiconductor World

E-beam lithography enables sub-10 nm patterning for prototyping, masks, and quantum devices with JEOL’s high-precision JBX systems.

Why Does an Electron Beam Provide Such High Resolution in Lithography?

An electron beam's nanometer-scale focus enables sub-10 nm lithography with unmatched precision and minimal blur.

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Overcoming Key Challenges in DRAM Transistor Formation Using E-Beams

In our article, we consider how e-beams are essential for overcoming key challenges in DRAM transistor formation. Discover more about their impact here.

How Does Field Ionization Work?

Field ionization works by using intense electric fields to remove electrons, preserving molecular ions for mass analysis and composition determination.

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